Scanning Electron Microscopy and EDS (Allentown Lab)

A powerful tool used to produce high resolution and magnification images of sample surface and near-surface topography

Scanning electron microscopy (SEM) analyzes materials, particles, surfaces and fibers so that fine details can be observed, assessed, and measured. Energy Dispersive X-ray Spectroscopy (EDS) can also be utilized to provide elemental information and identification. Coupled together, SEM and SEM/EDS provide a powerful means for industry to resolve contamination issues, investigate component failure, identify unknown particulates or study the interaction between substances and their substrates.

Our skilled team of scientists at Intertek use SEM/EDS to examine:

Films & Packaging
Coatings
Minerals & Chemicals
Materials (Metals, Polymers, Ceramics & Composites)
Semi-Conductors
Catalysts
Surfaces & Cross-sections
Contaminates
Residue
Dust & Debris
Unknown Substances

We use SEM/EDS to analyze for:

Morphology (Shape)
Surface Texture
Elemental Composition
Visualization
Particle Size
Particulate & Unknown Identification
Layer Thickness & Composition
Delamination
Inclusions, Second Phases & Voids
Microstructure
Corrosion
Surface Pitting

SEM Instrument Capabilities

Instrument	Magnification	Detectors	Energy Dispersive Spectroscopy	Sample Size	Vacuum
Variable Pressure Scanning Electron Microscope (VP-SEM)	25x – 10,000x	Secondary Electron, Backscatter Electron	Silicon Drift Detector	Up to 35 mm height, 200 mm width	High Vacuum, Low Vacuum (1-200 Pa)
Field Emission Scanning Electron Microscope (FE-SEM)	25x – 800,000x	Secondary Electron (In-Lens and E-T), Backscatter Electron (YAG-BSE), Transmitted Electron	Silicon Lithium Detector	Up to 15 mm height, 150 mm width	High Vacuum

Remote View Scanning Electron Microscopy Services
Remote View SEM enables real-time interaction with the analyst and instrument allowing direct examination of failures, surface features, and particle shapes in order to accelerate critical decision making in support of failure or quality investigations or product development.

Scanning Transmission Electron Detector (STEM)
Use of a scanning transmission electron detector (STEM) allows the laboratory to form images using electrons passing through a thin sample.

Industry specific questions that SEM/EDS can help answer:

What is this unknown material I found?
What is this residue on my product?
How do I determine if the coating on my product is intact or has voids?
What does my material look like at the micro level?
Does my material have any surface texture?
What is the size and shape of the particles in my powder?
How thick are the layers in my sample?

Additional In-house Expertise:

Intertek Allentown hosts a wide variety of analytical techniques and instruments. Our analysis plans can be adjusted to answer any questions that come up during the analysis process. Some examples of how our integrated approach can help you: